TETRAVINYLSILANE CAS#: 1112-55-6; 凯望编码 (ChemWhat Code): 66514

IdentificationPhysical DataSpectra
Route of Synthesis (ROS)Safety and HazardsOther Data

Identification

英文名TETRAVINYLSILANE
IUPAC Nametetrakis(ethenyl)silane 
分子结构TETRAVINYLSILANE-CAS-1112-55-6
CAS编号 1112-55-6
EINECS Number2214-192-0
MDL NumberMFCD00008607
别名Tetravinylsilane
1112-55-6
Silane, tetraethenyl-
tetrakis(ethenyl)silane
Silane, tetravinyl-
tetraethenylsilane
TQO34MU4LJ
NSC-113262
92717-78-7
tetravinyl silane
tetravinyl-silane
EINECS 214-192-0
NSC113262
NSC 113262
Tetravinylsilane, 97%
UNII-TQO34MU4LJ
TETRAETHYLENESILICON
(CH2=CH)4Si
DTXSID6061490
MFCD00008607
AKOS028110984
AS-44343
NS00044351
J-002546
分子式C8H12Si
分子量136.27
InChIInChI=1S/C8H12Si/c1-5-9(6-2,7-3)8-4/h5-8H,1-4H2
InChI KeyUFHILTCGAOPTOV-UHFFFAOYSA-N
Isomeric SMILESCC=C[Si](C=C)(C=C)C=C  
Patent Information
Patent IDTitlePublication Date
JP2020/79219METHOD FOR PRODUCING TETRAALKENYLSILANE2020
US2014/296468Hydrosilylation Reaction Catalysts and Curable Compositions and Methods for Their Preparation and Use2014

Physical Data

Appearanceclear liquid
Boiling Point, °CPressure (Boiling Point), Torr
125
130.6
130.2746.1
Density, g·cm-3Reference Temperature, °CMeasurement Temperature, °C
0.997
0.7984420
0.7926425
0.8420

Spectra

Description (NMR Spectroscopy)Nucleus (NMR Spectroscopy)Solvents (NMR Spectroscopy)Frequency (NMR Spectroscopy), MHz
Chemical shifts1H400.1
Spectrum29Sivarious solvent(s)59
Chemical shifts13CCDCl3
Chemical shifts13C
Chemical shifts29Si
Description (IR Spectroscopy)
Bands
Spectrum

Route of Synthesis (ROS)

Route of Synthesis (ROS) of TETRAVINYLSILANE CAS 1112-55-6
Route of Synthesis (ROS) of TETRAVINYLSILANE CAS 1112-55-6
ConditionsYield
With palladium(II) acetylacetonate; potassium fluoride In N,N-dimethyl-formamide at 130℃; under 1500.15 Torr; for 3h; Reagent/catalyst; Time; Hiyama Coupling; Inert atmosphere;

Experimental Procedure
General procedure: A mixture of organohalides (1a-h) (0.25mmol), vinysilanes 2a (0.3mmol) or 2c (0.075mmol), potassium fluoride (0.6mmol), and supported palladium NPs catalyst (Pd/substrate ratio 1mol%) was suspended in DMF (1ml). Then, the flask was evacuated under vacuum and refilled with argon. The evacuation/refilling cycle was repeated three times (pressure 2bar). The mixture was stirred at 130°C, and the reaction was monitored by GC and GC-MS. The reaction was performed for the time required ranging from 1.5 to 24h, to obtain the maximum yield of 3a-h products.
93%

Safety and Hazards

Pictogram(s)
SignalDanger
GHS Hazard StatementsH225 (100%): Highly Flammable liquid and vapor [Danger Flammable liquids]
H315 (74.51%): Causes skin irritation [Warning Skin corrosion/irritation]
H319 (74.51%): Causes serious eye irritation [Warning Serious eye damage/eye irritation]
H332 (19.61%): Harmful if inhaled [Warning Acute toxicity, inhalation]
H335 (100%): May cause respiratory irritation [Warning Specific target organ toxicity, single exposure; Respiratory tract irritation]
H361 (23.53%): Suspected of damaging fertility or the unborn child [Warning Reproductive toxicity]
H400 (23.53%): Very toxic to aquatic life [Warning Hazardous to the aquatic environment, acute hazard]
H410 (23.53%): Very toxic to aquatic life with long lasting effects [Warning Hazardous to the aquatic environment, long-term hazard]
Precautionary Statement CodesP203, P210, P233, P240, P241, P242, P243, P261, P264, P264+P265, P271, P273, P280, P302+P352, P303+P361+P353, P304+P340, P305+P351+P338, P317, P318, P319, P321, P332+P317, P337+P317, P362+P364, P370+P378, P391, P403+P233, P403+P235, P405, and P501
(The corresponding statement to each P-code can be found at the GHS Classification page.)

Other Data

Druglikeness
Lipinski rules component
分子量136.269
logP3.544
HBA0
HBD0
Matching Lipinski Rules4
Veber rules component
Polar Surface Area (PSA)0
Rotatable Bond (RotB)4
Matching Veber Rules2
Use Pattern
Tetraethoxysilane plays significant roles in semiconductor, photovoltaic, surface modification, and nanotechnology fields. Tetraethoxysilane can be employed in chemical vapor deposition (CVD) processes for the growth of silicon films, which are utilized in the semiconductor industry for integrated circuit fabrication.

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